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2011

Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process

11 years 8 months ago
Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process
Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker
Added 14 May 2011
Updated 14 May 2011
Type Journal
Year 2011
Where MR
Authors Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker
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